IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 334 - 342
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 247 - 257
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 117 - 122
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 119 - 129
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 146 - 151
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 130 - 137
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 540 - 557
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 509 - 517
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 531 - 539
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 524 - 530
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 6 - 13
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 98 - 121
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 47 - 61
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 22 - 34
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 79 - 97
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 62 - 71
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 72 - 78
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 509 - 518
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 526 - 535